Thorsten Dziomba, a scientist in Working group 5.14, has been awarded the title "The Best Young Metrologist of COOMET" for his working "Turning Scanning Probe Microscopy into a more quantitative method".
In his outstanding lecture he presented a complete traceability chain for Scanning Probe Microscopy (SPM), ranging from the realization of the SI base unit "metre" at the NMI to the SPM user, e.g. in industry. ... more
Dr. Hans U. Danzebrink (Working group leader 5.15) was awarded a prize for his short film "Dimensionen" in a competition regarding best images, animations and movies in the area of nanoscience. ... more
Project "openGPS: Open Source Implementattion for 3D Surface Characterisation"
More Information: here (password)

Tasks and aims

Traceable measuring techniques for dimensional variables of surfaces are the basis for an accompanying quality assurance in research, development and production. In particular for the field of nano-technology there is an additional strong linkage between dimensional and other physical and chemical properties.
The group Surface Metrology regards it as its goal to develop and to improve measurement devices and instruments for the measurement of small structures on surfaces in the fields of micro system technique, nano-technology and the surface measuring techniques (roughness -, hardness - and layer thickness, etc.) in order to reach smaller uncertainties surely. This includes the development and calibration of standards for the dissemination of dimensional properties to DKD and industry too.
The group is involved in the Avogadro project as well as in several national and international projects.