Working Group 5.14
Roughness Measuring Methods
– Interference microscopy
– Developments in the field of interference
microscopy
– Development of measurement standards
– Scattered light measuring procedures
– Standards in the Roughness Measuring
Techniques
– Publications
– Measurement and calibration capabilities
Contact persons
| Working group leader Interference microscopy, Profile methods, Calibration standards | Dr.-Ing. Krüger-Sehm +49
(0) 531 592-5121 +49
(0) 531 592-69-5121
rolf.krueger-sehm@ptb.de |
| Scattered
light measuring procedures
, Profile methods | Dr.
Peter Thomsen-Schmidt +49
(0) 531 592-5198
peter.thomsen-schmidt@ptb.de |
| Profile methods, Calibrations | Dipl.-Ing.
Lena Jung +49
(0) 531 592-5124
lena.jung@ptb.de |
| adress | Physikalisch-Technische
Bundesanstalt
AG 5.16 Mikrosystemmesstechnik
Bundesallee 100
38116 Braunschweig |
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© Physikalisch-Technische Bundesanstalt (PTB)
Page created: 2004-04-26, last update: 2008-04-02, Silke Hube
Page created: 2004-04-26, last update: 2008-04-02, Silke Hube
