Working Group 5.14

Roughness Measuring Methods

–  Development of profile methods
–  Interference microscopy
–  Developments in the field of interference
     microscopy
–  Development of measurement standards
–  Scattered light measuring procedures
–  Standards in the Roughness Measuring
     Techniques

| –  Contact persons
–  Publications
–  Measurement and calibration capabilities

Tasks and aims

It is the task of the Working Group to develop and improve measuring devices, measuring procedures and calibration standards used in the field of surface roughness. Cooperation in bodies and advisory services allows the contact to industrial problems to be maintained.

• Development of an interference microscope with direct traceability for the measurement of depth setting standards with depths of profile until 100 µm
• Development of a profilometer for areal measurement with tactile and optical sensors
• Traceabilty of scattered light measurements in the visible wavelength region to other surface measuring techniques

Contact