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| PTB > | Structure > Division 5 > Department 5.1 > Working Group 5.14

Working Group 5.14

Roughness Measuring Methods

Symbol der Arbeitsgruppe

– Development of profile methods
– Interference microscopy
– Developments in the field of interference
microscopy
– Development of measurement standards
– Scattered light measuring procedures
– Standards in the Roughness Measuring
Techniques

| – Contact persons
– Publications
– Measurement and calibration capabilities

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Development of calibration standards

Geometrical standards

function

Calibration of the vertical and horizontal measurement system of contact stylus instruments

specifications

Manufactured by single diamond turning
Pure sinusoidal profile (type C nach ISO 5436-1)
DLC-(„Diamond like Carbon“) covering for increased resistance to wear and reduction of friction
Layout of proven „Halle“-roughness calibration standards
Useable width of profile about 5 mm
3 different types with the following nominal values:

type	use for cutoff in mm	amplitude Pt in µm	period in µm	peakcount PC per cm	profile length acc. ISO 4288 in mm	realised length of profile in mm
fine	0.25	0.4	50	200	1.25	4
medium	0.8	3	140	71	4.0	8
coarse	2.5	15	450	22	12.5	20

Chirp-standard

function

Testing of the transfer behaviour of surface measuring instruments by a set of different spatial wavelengths

specifications

Wavelengths from 10 µm to 91 µm
Wavelength change steps of about 10%
24 wavelentgh values (according to „E-24-series“)
constant amplitude (Pt) of 1 µm
At wavelength 10 µm:
smallest curvature about 5 µm
maximum slope about 0.3 rad
At wavelength 91 µm:
biggest curvature about 300 µm
smallest slope ca. 0.04 rad

Foto: Ausschnitt Chirp-Normal

Figure 1: section of Chirp-standard

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© Physikalisch-Technische Bundesanstalt (PTB)
Page created: 2004-04-26, last update: 2008-04-02, | Silke Hube

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