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Structure
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Division 5
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Department 5.1
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Working Group 5.11
Working Group 5.11
Nanoforce Metrology for Tactile Sensors
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3D-micor-measuring device
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Probing Methods for microstructures
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Collaborative research centre 516
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Micro- and nano-force metrology
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Standards for micro-metrology
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Standards and Guidelines
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Contact persons
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Publications
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Measurement and calibration capabilities
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Probing methods for micro structures
Overview over different probing methods for micro structures used in working group 5.11:
3d-micro-probe
Si-Cantilever sensors
3d-calibration device for the dynamical calibration of micro systems
© Physikalisch-Technische Bundesanstalt (PTB)
Page created: 2004-04-26, last update: 2007-08-13,
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S. Hube
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