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Generation and measurement of electrical subnanosecond pulses
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Generation and measurement of electrical subnanosecond pulses

Devices for generation and measurement of fast electrical pulses are to be encountered in nearly every field of industry today. DIN EN ISO/IEC 17025 requires the calibration of these many different measuring devices. This is task of the DKD calibration laboratories. The traceability of the reference standards of the DKD laboratories is task of PTB.

Oscilloscopes with a bandwidth of 50 GHz or more represent the top in the calibration hierarchy. The traceability of these devices to the national standards is no more possible with traditional methods. For such calibrations, please contact the team of working group 2.54 "Terahertz-Optics".

The working group 2.21 offers DKD laboratories calibration of the rise time of their electric pulse standards. The measurement parameters for generators with external trigger possibility are given in the following table:

measuring parameter
measurement uncertainty
rise time
tr
amplitude
U
repetition frequency
f
k = 2
10 ps
100 mV ≤ U &le 1 V
f > 100 Hz
2,5 ps
15 ps
100 mV ≤ U &le 1 V
f > 100 Hz
2,0 ps
20 ps
100 mV ≤ U &le 1 V
f > 100 Hz
1,5 ps
100 ps
100 mV ≤ U &le 1 V
f > 100 Hz
1,7 ps
>100 ps
100 mV ≤ U ≤ 1 V
f > 100 Hz
1 ps + 0,01*tr

The calibration of impulses with amplitudes larger then 1 V is also possible via additional attenuators by a correspondingly higher measurement uncertainty.

The traceability of calibration generators according to CISPR 16 for EMI receiver to the national standards is also offered by working group 2.21.

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Contact

Kai Baaske
Phone: +49-531-592-2212
Fax:    +49-531-592-2256
E-Mail: Kai Baaske
 

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Page created: 08/03/2004, last update: 02/02/2010, Jürgen Rühaak