Microparts: Publications

References

	R Rantoson, H Nouira, M-S Charyar and N Anwer Novel automated methods for coarse and fine registration of point clouds in high precision metrology Robotics and Computer-Integrated Manufacturing (0) accepted
	R Rantoson, H Nouira, M-S Charyar and N Anwer Novel curvature-based registration for dimensional metrology IEEE transaction on Instrumentation and Measurment (0) submitted
	Simulation of surface roughness measurements by focus variation microscopy Appl. Opt. (0) to be published
	A J Henning, C L Giusca, A B Forbes, I M Smith, R K Leach, J M Coupland and R Mandal Correction for lateral distortion in coherence scanning interferometry CIRP Ann. - Manuf. Technol. 62, 547 - 550 (2013) DOI: 10.1016/j.cirp.2013.03.026
	R Mandal, J M Coupland, R K Leach and D Mansfield Coherence scanning interferometry: measurement and correction of 3D transfer and point-spread characteristics Applied Optics 53, 1554 - 1563 (2014) DOI: 10.1364/AO.53.001554
	R K Leach, A Weckenmann, J M Coupland and W Hartmann Interpreting the probe-surface interaction of surface measuring instruments, or what is a surface? Surf. Topog.: Met. Props 2 (2014) DOI: 10.1088/2051-672X/2/3/035001
	D-Y Sheu, J D Claverley and R K Leach Testing the mechanical characteristics and contacting behavior of novel manufactured and assembled sphere-tipped styli for micro-CMM probes Precision Assembly Technologies and Systems 435, 15 - 22 (2014) DOI: 10.1007/978-3-662-45586-9_3
	M Fleßner, V Nemanja, E Helmecke and T Hausotte Determination of metrological structural resolution of a CT system using the frequency response on surface structures 2014 DOI: 10.7795/810.20150223B
	R Bergmans, G Kok, H Nieuwenkamp and P Sonin Multi-sensor metrology for microparts in innovative industrial products 2014
	A Küng, A Nicolet and F Meli Wear study of diamond coated probe tips when scanning on different materials Measurement Science and Technology 26 (2015) DOI: 10.1088/0957-0233/26/8/084005
	X Feng, P Kinnel and S Lawes A review of cleaning methods for surface contamination on micro-CMM probes Precision Engineering (2015) to be published
	M Fleßner, M Blauhöfer, E Helmecke, A Staude and T Hausotte CT measurements of microparts: Numerical uncertainty determination and structural resolution 2015 accepted

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