Publications and Presentations

2012

Stintz M, Hillemann L: Current international standardization in particle characterization and release testing. Int. Conference on Safe production and use of nanomaterials, Nanosafe 2012, November 13th -15th, Grenoble, France

2013

Gao S, Brand U, Koenders L: Determination of the mechanical properties of nanopillars using a Hysitron Nanoindenter T1950. Poster presented at Nanobrücken Dresden, March 20-22, 2013 in Dresden, Germany.

Gao S, Brand U: In-situ nondestructive characterization of the normal spring constant of AFM cantilevers. Poster presented at the Nanoscale Conference 2013, April 25th - 26th, in Paris, France

Gao S, Brand U: Toward quantitive investigation of the mechanical properties of nano-objects using nano-indentation technique. Poster presented at the Nanomeasure conference 2013, 25-26 June, University of Warsaw, Poland

Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulation of AFM indentation of gold nanoclusters and nanorods.  Presentation at ACSIN-12 & ICSPM21, November 4-8, 2013, Tsukuba, Japan.

Stintz M, Fiala P and Göhler D: Preparation methods for single nano-objects on flat substrates. PARTEC - Int. Congress on Particle Technology, April 23th - 25th, 2013 in Nuremberg, Germany

2014

Charátová Campbell A, Klapetek P, Martinek J:  Roughness effects in nanoindentation on thin films.  Poster presented at E-MRS Spring Meeting 2014, May 27-30, Lille, France.

Gao S, Brand U, Li Z:  In-Situ determination of the spring constant of AFM cantilevers using MEMS nanoforce transducer.  Poster presented at EUSPEN 2014, June 2-6, Dubrovnik, Croatia.

Gao S, Brand U: In-situ nondestructive characterization of the normal spring constant of AFM cantilevers. Meas. Sci. Technol., 25, 4 (2014), pp. 044014

Gao S, Brand U:  Determination of the mechanical properties of silicon nanopillars using CR-FM method.  Poster presented at SPIE Photonics Europe (2014), April 14-17, Brussels, Belgium.

Gao S, Brand U: Towards traceable mechanical properties measurement of silicon nanopillars using contact resonance force microscopy. SPIE Photonics Europe (2014), pp. 91321D–91321D

Husu H, Korpelainen V, Vesamo S, Reischl B, Nordlund K, Lassila L: Traceable measurement of mechanical properties of nanoparticles, nanorods and nanowires.  Presentation at Physics Day 2014, March 11-13, Tampere, Finland.

Lazzerini G M, Paternò G, Cacialli F, Yacoot A:  High-resolution atomic force microscopy of high-quality, solvent-free crystals of (6,6)-phenyl-C61-butyric acid methyl ester. Poster presented at E-MRS Spring Meeting 2014, May 26-20, Lille, France.

Li Z, Gao S, Pohlenz F, Brand U, Koenders L, Peiner E:  Determination of the mechanical properties of nano-pillars using the nanoindentation.  Nanotechnology and Precision Engineering 3, 182-188, 2014.

Reischl B, Kuronen A, Nordlund K:  Nanoindentation of gold nanorods with an Atomic Force Microscope, Materials Research Express 1, 045042, November 28, 2014.

Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulation of AFM indentation of gold nanoclusters and nanorods.  Poster presented at Towards Reality in Nanoscale Materials VII, February 10-12, Levi, Finland.

Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulations of nanoindentation of gold nanorods using an atomic force microscope.  Presentation at Physics Day 2014, March 11-13, Tampere, Finland.

Stintz M, Fiala P:  Particle preparation methods on substrates for Electron Microscopy and Atomic Force Microscopy.  Presentation at DIN INS-Workshop, July 11, Berlin, Germany.

Wollschläger N, Österle W, Stewart M:  A Systematic Study of Ga+ Implantation in a PTZ Film during Focused Ion Beam Micro-machining.  Poster presented at E-MRS Spring Meeting 2014, May 27-30, Lille, France.

2015

Brand U, Gao S, Doering L, Li Z, Xu M, Buetefisch S, Peiner E, Fruehauf J, Hiller K: Smart sensors and calibration standards for high precision metrology. (2015), 9517, pp. 95170V–95170V–10

Gao S, Brand U, Hahn S, Hiller, K:  An active reference spring array for in-situ calibration of the normal spring constant of AFM cantilevers, poster presented at SPIE Microtechnologies, May 4-6, 2015, Spain

Lazzerini G M, Paternò G, Cacialli F, Yacoot A: High-resolution atomic force microscopy of high-quality, solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester, poster presented at 5th UK-Korea Workshop on Plastic Electronics, February 26, 2015, United Kingdom

Wollschläger N, Österle W, Häusler I, Stewart M:  Ga+ implantation in a PZT film during focused ion beam micro-machining.  Physica Status Solidi C 12 No.3, 314-317, February 4, 2015.

Reischl B, Kuronen A, Nordlund K, Husu H and Korpelainen V: Atomistic simulation of AFM indentation of gold nanorods on a silicon substrate, Submitt. to J Phys Chem C. 2015

Tantra R: Nanomaterial Characterization: An Introduction CHAPTER 3. Reference Nanomaterials. Submitt. to Wiley.

Wollschläger N, Reinstädt P, Österle W and Griepentrog M: Comparison of two methods for the Young´s Modulus determination of thin silicon nitride films:  In-situ cantilever bending and instrumented indentation technique. Submitt. to Thin Solid Films, 2015.

Wollschläger N, Tasdemir Z, Häusler I, Leblebici Y, Österle W and Alaca B E: Elastic properties of silicon nanowires. Submitt. to Appl. Phys. Lett., 2015.

Brand U, Li Z, Gao S, Hahn S and Hiller K: Silicon double spring for the simultaneous calibration of probing forces and deflections in the micro range. Meas. Sci. Technol., 27, 015601, Jan. 2016.

Vesamo S: Determination of spring constants in atomic force microscopes. Master Thesis Aalto Univ. Libr., Sep. 2014.

Li Z, Gao S, Brand U, Hiller K, Wollschläger N and Pohlenz F: Nanomechanical characterization of soft materials using a micro- machined nanoforce transducer with a FIB-made pyramidal tip. Submitt. to Rev Sci Instr, 2015.

Tasdemir Z, Wollschläger N, Österle W, Leblebici Y and Alaca E: A Deep Etching Mechanism for Trench-Bridging  Silicon Nanowires. Submitt. to Nanotechnol., 2015.

Opens internal link in current windowWollschläger N, Reinstädt P, Österle W and Griepentrog M: Comparison of two methods for the Young´s Modulus determination of thin silicon nitride films:  In-situ cantilever bending and instrumented indentation technique. Internal report available at https://www.ptb.de/emrp/mechprono-publications.html