2012
Stintz M, Hillemann L: Current international standardization in particle characterization and release testing. Int. Conference on Safe production and use of nanomaterials, Nanosafe 2012, November 13th -15th, Grenoble, France
2013
Gao S, Brand U, Koenders L: Determination of the mechanical properties of nanopillars using a Hysitron Nanoindenter T1950. Poster presented at Nanobrücken Dresden, March 20-22, 2013 in Dresden, Germany.
Gao S, Brand U: In-situ nondestructive characterization of the normal spring constant of AFM cantilevers. Poster presented at the Nanoscale Conference 2013, April 25th - 26th, in Paris, France
Gao S, Brand U: Toward quantitive investigation of the mechanical properties of nano-objects using nano-indentation technique. Poster presented at the Nanomeasure conference 2013, 25-26 June, University of Warsaw, Poland
Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulation of AFM indentation of gold nanoclusters and nanorods. Presentation at ACSIN-12 & ICSPM21, November 4-8, 2013, Tsukuba, Japan.
Stintz M, Fiala P and Göhler D: Preparation methods for single nano-objects on flat substrates. PARTEC - Int. Congress on Particle Technology, April 23th - 25th, 2013 in Nuremberg, Germany
2014
Charátová Campbell A, Klapetek P, Martinek J: Roughness effects in nanoindentation on thin films. Poster presented at E-MRS Spring Meeting 2014, May 27-30, Lille, France.
Gao S, Brand U, Li Z: In-Situ determination of the spring constant of AFM cantilevers using MEMS nanoforce transducer. Poster presented at EUSPEN 2014, June 2-6, Dubrovnik, Croatia.
Gao S, Brand U: In-situ nondestructive characterization of the normal spring constant of AFM cantilevers. Meas. Sci. Technol., 25, 4 (2014), pp. 044014
Gao S, Brand U: Determination of the mechanical properties of silicon nanopillars using CR-FM method. Poster presented at SPIE Photonics Europe (2014), April 14-17, Brussels, Belgium.
Gao S, Brand U: Towards traceable mechanical properties measurement of silicon nanopillars using contact resonance force microscopy. SPIE Photonics Europe (2014), pp. 91321D–91321D
Husu H, Korpelainen V, Vesamo S, Reischl B, Nordlund K, Lassila L: Traceable measurement of mechanical properties of nanoparticles, nanorods and nanowires. Presentation at Physics Day 2014, March 11-13, Tampere, Finland.
Lazzerini G M, Paternò G, Cacialli F, Yacoot A: High-resolution atomic force microscopy of high-quality, solvent-free crystals of (6,6)-phenyl-C61-butyric acid methyl ester. Poster presented at E-MRS Spring Meeting 2014, May 26-20, Lille, France.
Li Z, Gao S, Pohlenz F, Brand U, Koenders L, Peiner E: Determination of the mechanical properties of nano-pillars using the nanoindentation. Nanotechnology and Precision Engineering 3, 182-188, 2014.
Reischl B, Kuronen A, Nordlund K: Nanoindentation of gold nanorods with an Atomic Force Microscope, Materials Research Express 1, 045042, November 28, 2014.
Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulation of AFM indentation of gold nanoclusters and nanorods. Poster presented at Towards Reality in Nanoscale Materials VII, February 10-12, Levi, Finland.
Reischl B, Nordlund K, Husu H, Korpelainen V, Lassila L: Atomistic simulations of nanoindentation of gold nanorods using an atomic force microscope. Presentation at Physics Day 2014, March 11-13, Tampere, Finland.
Stintz M, Fiala P: Particle preparation methods on substrates for Electron Microscopy and Atomic Force Microscopy. Presentation at DIN INS-Workshop, July 11, Berlin, Germany.
Wollschläger N, Österle W, Stewart M: A Systematic Study of Ga+ Implantation in a PTZ Film during Focused Ion Beam Micro-machining. Poster presented at E-MRS Spring Meeting 2014, May 27-30, Lille, France.
2015
Brand U, Gao S, Doering L, Li Z, Xu M, Buetefisch S, Peiner E, Fruehauf J, Hiller K: Smart sensors and calibration standards for high precision metrology. (2015), 9517, pp. 95170V–95170V–10
Gao S, Brand U, Hahn S, Hiller, K: An active reference spring array for in-situ calibration of the normal spring constant of AFM cantilevers, poster presented at SPIE Microtechnologies, May 4-6, 2015, Spain
Lazzerini G M, Paternò G, Cacialli F, Yacoot A: High-resolution atomic force microscopy of high-quality, solvent-free crystals of [6,6]-phenyl-C61-butyric acid methyl ester, poster presented at 5th UK-Korea Workshop on Plastic Electronics, February 26, 2015, United Kingdom
Wollschläger N, Österle W, Häusler I, Stewart M: Ga+ implantation in a PZT film during focused ion beam micro-machining. Physica Status Solidi C 12 No.3, 314-317, February 4, 2015.
Reischl B, Kuronen A, Nordlund K, Husu H and Korpelainen V: Atomistic simulation of AFM indentation of gold nanorods on a silicon substrate, Submitt. to J Phys Chem C. 2015
Tantra R: Nanomaterial Characterization: An Introduction CHAPTER 3. Reference Nanomaterials. Submitt. to Wiley.
Wollschläger N, Reinstädt P, Österle W and Griepentrog M: Comparison of two methods for the Young´s Modulus determination of thin silicon nitride films: In-situ cantilever bending and instrumented indentation technique. Submitt. to Thin Solid Films, 2015.
Wollschläger N, Tasdemir Z, Häusler I, Leblebici Y, Österle W and Alaca B E: Elastic properties of silicon nanowires. Submitt. to Appl. Phys. Lett., 2015.
Brand U, Li Z, Gao S, Hahn S and Hiller K: Silicon double spring for the simultaneous calibration of probing forces and deflections in the micro range. Meas. Sci. Technol., 27, 015601, Jan. 2016.
Vesamo S: Determination of spring constants in atomic force microscopes. Master Thesis Aalto Univ. Libr., Sep. 2014.
Li Z, Gao S, Brand U, Hiller K, Wollschläger N and Pohlenz F: Nanomechanical characterization of soft materials using a micro- machined nanoforce transducer with a FIB-made pyramidal tip. Submitt. to Rev Sci Instr, 2015.
Tasdemir Z, Wollschläger N, Österle W, Leblebici Y and Alaca E: A Deep Etching Mechanism for Trench-Bridging Silicon Nanowires. Submitt. to Nanotechnol., 2015.