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Fachabteilungen > Abt. 5 Fertigungsmesstechnik > 5.4 Interferometrie an Maßverkörperungen > 5.44 Interferometrie an prismatischen Körpern > Publikationen
Interferometrie an prismatischen Körpern
Arbeitsgruppe 5.44

 

Publikationen  /  Publications

2011    2010 - 2008    Publikationen2007 - 2005    2004-2002       

2001 - 1989



2012 - 2011

  • Bartl, G.; Schödel, R.:
    "Scanning phase shift interferometry in length measurement."
    MacroScale 2011 - recent developments in traceable dimensional measurements, Bern-Wabern 04-06, October, 2011, Switzerland
    MacroScale 2011 proceedings : recents developments in traceable dimensional measurements: 2012. [online only], 6 S.
    Identifier: www.    macroscale.org/macroscale/macroscale-proceedings-list.html

  • Schödel, R.; Walkov, A.; Zenker, M.; Bartl, G.; Meeß, R.; Hagedorn, D.; Gaiser, C.; Thummes, G.; Heltzel, S.:
    "A new precision interferometer for absolute length measurements down to cryogenic temperatures"
    MacroScale 2011 - Conference on Recent Developments in Traceable Dimensional Measurements, Bern-Wabern 04-06, October, 2011, Switzerland;
    Measurement Science and Technology: 23 (2012), 9, 094004-1 - 0904004-19;
    Identifier dx.doi.org/10.1088/0957-0233/094004; ISSN 0957-0233 ; Verlag IOP, Bristol

  • Schödel, R.; Thummes, G.; Heltzel, S.:
    "Enhancement of PTB´s precision interferometer for  characterization of ultra stable materials at cryogenis temepratures."
    Proceedings of the 12th European Conference on Spacecraft Structures, Materials & Environmental Testing ; (ESA SP:691): (2012) [CD-ROM] file name: s13c_4schoed.pdf, 6 S. ;  ISBN 978-92-9092-255-1 ; Verlag ESA Communications, Noordwijk

  • Abdelaty, A.; Walkov, A.; Franke, P.; Schödel, R.:
    "Challenges on double ended gauge block interferometry uveiled by the study of a prototyp at PTB."
    Metrolgia: 49 (2012), 3, 307 - 314 ; Identifier: dx.doi.org/10.1088/0026-1394/49/3/307 ; ISSN 0026-1394 ; Verlag IOP, Bristol

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2010 - 2008

  • Abdelaty, A.; Walkov, A.; Abou-Zeid, A.; Schödel, R.:
    " PTB´s prototyp of a double ended interferometer for measuring the length of gauge blocks"
    Simposio de Metrología 2010: (2010) [online]
    Identifier: www.cenam.mx/simposio2010/info/pmiercoles/sm2010-mp06c.pdf
    Simposio de Metrolgia 2010, Santiago de Querétaro, 27-29, October, 2010, Mexico

  • Schödel, R.; Walkov, A.:
    "Das neu aufgebaute Ultrapräzisionsinterferometer"
    PTB-Mitteilungen: 120 (2010), 1, 11 - 15
    Identifier:     www.ptb.de/de/publikationen/mitteilungen/2010/1/10_1_02.pdf
    ISSN 0030-834X, Verlag: Bremerhaven; Wirtschaftsverlag NW

  • Schödel, R.:
    "Einige Grundlagen der interferentiellen Längenmessung"
    PTB-Mitteilungen: 120 (2010), 1, 3 - 10
    Identifier: www.ptb.de/de/publikationen/mitteilungen/2010/1/10_1_01.pdf
    ISSN 0030-834X, Verlag: Bremerhaven; Wirtschaftsverlag NW

  • Schödel, R.:
    "Limiting aspects in length measurements by interferometry"
    Fringe 2009: the 6th international Workshop on Advances Optical Metrology (2009), 256-262
    Identifier: dx.doi.org/10.1007/978-3-642-03051_2_43
    Verlag: Berlin: Springer

  • Bartl, G.; Nicolaus, A.; Kessler, E.; Schödel, R. ; Becker, P.:
    "The coefficient of thermal expansion of highly enriched 28Si. "
    Metrologia: 46 (2009)
    Identifier:  dx.doi.org/10.1088/0026-1394/46/5/005
    stacks.iop.org/0026-1394/46/416
    Verlag: Bristol: IOP

  • Schödel, R. ; Meiners-Hagen, K.; Pollinger, F.; Abou-Zeid, A.:
    "Precision length measurements by multi-wavelength interferometry. "
    Measurement 2009: 7th International Conference on Measurement; Smolenice, 20-23, May, 2009, Slovakia; proceedings: (2009), 241-253
    Verlag: Bratislava: Institute of Measurement Science, SAS

  • Meiners-Hagen, K.; Schödel, R. ; Pollinger, F.; Abou-Zeid, A.: 
    "Multi-wavelength interferometry for length measurements using diode lasers. "
    Measurement Science Review: 9 (2009), 1, 16-25
    Identifier: dx.doi.org/10.2478/v10048-009-0001-y
    Verlag: Warsaw: Versita
     
  • Schödel, R. ; Meiners-Hagen, K.; Nicolaus, A.; Abou-Zeid, A.:
    "Absolute Längenmessungen mittels optischer Interferometrie - Rückführbarkeit auf das Meter nach SI = Absolute length measurements by means of optical interferometry - traceability to the SI meter. "
    Technisches Messen: 76 (2009), 3, 122 - 132
    Identifier: dx.doi.org/10.1524/teme.2009.0922
    Verlag: München: Oldenburg
     
  • Schödel, R. ; Abou-Zeid, A.:
    "High accuracy measurements of long-term stability of material with PTB’s Precision Interferometer "
    Fifth International Symposium on Instrumentation Science and Technology; (Proceedings of SPIE:7133,2): (2009), 71333J-1 - 71333J-9
    Identifier:   dx.doi.org/10.1117/12.809987
    Verlag: Bellingham, Wash.: SPIE     
     
  • Schödel, R.:
    "Length and size"
    Handbook of optical metrology: principles and applications (2009), 365-390, Verlag: Boca Raton [u.a.]  : CRC Press, Taylor & Fracis

  • Yamada, N.; Matsumoto, H.; Sassi, M.; Thalmann, R.; Lassila, A.; Schödel, R.; Castollo, H. A.; Balling, P.:
    "Final report on the thermal expansion coefficient of gauge blocks (APMP.L-S1)"
    Metrologia 45 (2008), Tech. Suppl., 04001 [Online only];
    Identifier: dx.doi.org/10.1088/0026-1394/45/1A/04001; ISSN 0026-1394; Verlag Bristol [u.a.] (2008)

  • Schödel, R.:
    "Ultra high accuracy thermal expansion measurements with PTB's precision interferometer"
    Measurement Science and Technology (2008) 19, 8, 084003-1 - 084003-11; Identifier www.iop.org/EJ/journal/-page=featured/0957-0233; dx.doi.org/10.1088/0957-0233/19/8/084003; ISBN / ISSN 0957-0233; Verlag Bristol: IOP

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2007 - 2005

  • Schödel, R.:
    "Ultra high accuracy thermal expansion measurements with PTB's Precision Interferometer"
    Proceedings of ISMTII 2007 : the 8th International Symposium on Measurement Technology and Intelligent Instruments (2007), 135 - 138; Verlag Sendai: Tohoku Univ., 8th International Symposium on Measurement Technology and Intelligent Instruments, Sendai, 24-27, September, 2007

  • Schödel, R.:
    "Compensation of wavelength dependent image shifts in imaging optical interferometry"
    Applied Optics 46 (2007), 30, 7464 - 7468;
    Identifier dx.doi.org/10.1364/AO.46.007464;
    ISSN 0003-6935, Verlag Washington, DC: USA (2007)

  • Schödel, R.; Walkov, A.; Abou-Zeid, A.:
    "High accuracy determination of water vapor refractivity by length interferometry"
    Optics Letters 31, 1979 - 1981 (2006)

  • Brand, U.; Schnädelbach, H.; Schödel, R.; Feist, C.; Hinzmann, G.:
    "New depth-setting standards with grooves up to 5 mm depth."
    Proc. of the 6th international conference, European Society for Precision Engineering and Nanotechnology: May 28th - June 1st, 2006, Baden bei Wien, Vienna. Vol. 1, 438 - 4341; ISBN 978-0-9553082-0-8 (2006)

  • Schödel, R.:
    "Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements"
    Proc. of SPIE 5879, 1-11 (2005)

  • Schödel, R.:
    "Investigation of thermal expansion homogeneity by optical interferometry"
    Proc. of SPIE 5858, 0Q-1 - 0Q-8 (2005)

  • Schödel, R.; Abou-Zeid, A.:
         "PTB’s precision interferometer for high accuracy characterization of thermal expansion properties of low expansion materials", In: Nanoscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range, Wilkening, G. and Koenders, L., eds.; ISBN 3-527-40502-X; ISBN 978-3-527-40502-2, pp. 500 - 514 (2005)

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2004 - 2002

  • Schödel, R.; Decker, J. E.:
    "Methods to recognize the sample position for most precise interferometric length measurements", Proc. of SPIE, 5532, 237-247 (2004)

  • Schödel, R.; Bönsch, G.:
    "Highest accuracy interferometer alignment by retroreflection scanning", Applied Optics, 43, 5738-5743 (2004)

  • Decker, J. E.; Schödel, R.; Doiron, T.; Bönsch, G.:
    "Phase step calibration extends 19th century standard into 21st", Laser Focus World 5/2004, 143-148 (2004)

  • Decker, J. E.; Schödel, R.; Bönsch, G.:
    "Considerations for the evaluation of measurement uncertainty in interferometric gauge block calibration applying methods of phase step interferometry", Metrologia, 41, L11-L17 (20    04)

  • Schödel, R.; Nicolaus, A.; Bönsch, G.:
         "Minimizing interferometer misalignment errors for measurement of sub-nanometer length changes", Proc. of SPIE 5190, 34-42 (2003)

  • Decker, J. E.; Schödel, R.; Bönsch, G.:
         "Next generation Kösters Interferometer", Proc. of SPIE 5190, 14-23 (2003)

  • Schödel, R.; Bönsch, G.:
    "Fortschritte in der interferometrischen Längenmessung zur hochgenauen Bestimmung der Kompressibilität und des thermischen Ausdehnungskoeffizienten", 47. IWK, TU Ilmenau 2002, CD-ROM, ISSN 1619-4098 / Tagungsband, ISSN-Nr. 0943-7207, S. 594-595 (2002)

  • Schödel, R.; Nicolaus, A.; Bönsch, G.:
    "Phase stepping interferometry: Methods to reduce errors caused by camera nonlinearities", Applied Optics, 41, 55-63 (2002)

  • Schödel, R.; Bönsch, G.:
    "Interferometric measurements of thermal expansion, length stability and compressibility of glass ceramics", Proc. of the 3rd euspen 2002, ISBN: 90-386-2883-8, 691-694 (2002)


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2001 -1998

  • Schödel, R.; Bönsch, G.:
         "Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 °C to 28 °C and compressibility", Proc. SPIE Vol 4401, p. 54 - 62 (2001)

  • Bönsch, G.; Schuster, H. J.; Schödel, R.:
         "Hochgenaue Temperaturmessung mit Thermoelementen", Technisches Messen 68, 550-557 (2001)

  • Bönsch, G.; Potulski, E.:
    "Measurement of the refractive index of air and comparison with modified Edlén's formulae", Metrologia: 35, 133 - 139 (1998)

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