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MATHMET 2016 - International Workshop on Mathematics and Statistics for Metrology


November, 7-9, 2016


PTB-Berlin, Abbestr. 2-12, 10587 Berlin, Germany


Markus Bär (PTB/EURAMET, Germany), Clemens Elster (PTB, Germany), and Antonio Possolo (NIST/SIM, USA)

Scientific Committee

Markus Bär (PTB/EURAMET, Germany), Maurice Cox (NPL, UK), Kensei Ehara (NMIJ, Japan), Stephen Ellison (LGC, UK), Clemens Elster (PTB, Germany), Nicolas Fischer (LNE, France), Alistair Forbes (NPL, UK), Gregory Kyriazis (INMETRO, Brazil), Juris Meija (NRC, Canada), Tony O' Hagan (University of Sheffield, UK), Leslie Pendrill (SP, Sweden), Francesca Pennecchi (INRIM, Italy),  Antonio Possolo (NIST/SIM, USA)


The workshop will provide a forum for applied mathematicians, statisticians, and metrologists to present and discuss contemporary methods and challenges in applications of mathematical models and statistical data analysis to measurement science. Specific areas of application that may have dedicated sessions include: measurement uncertainty and uncertainty quantification, reference materials and chemometrics, calibrations, interlaboratory studies (including key comparisons and proficiency tests), nanometrology and optics, dimensional metrology, measurements in medicine, forensics, medical and industrial imaging, atmospheric science and climatology, and molecular biology.

Invited Speakers

  • Olha Bodnar (PTB, Germany)
  • Nicolas Fischer (LNE, France)
  • Alistair Forbes (NPL, UK)
  • Tony O' Hagan (University of Sheffield, UK)
  • Sebastian Heidenreich (PTB, Germany)
  • Leslie Pendrill (SP, Sweden)
  • Adrian Sandu (VirginiaTech/NIST, USA)
  • Blaza Toman (NIST, USA)
  • Adriaan van der Veen (VSL, the Netherlands)

Abstract Submission:      CLOSED


      1 July - 23 October 2016
290 € (until 31 August 2016)
370 € (after 31 August 2016)

For details see registration form.


To be announced.


Metrologia has agreed to publish a Focus Issue featuring a selection of the conference papers. The Scientific Committee will review the submitted abstracts and invite full papers for a subset of them. All papers selected for submission to Metrologia will of course be subject to the journal’s regular peer-review process. Details will be announced later.