Tasks and aims
Department 5.1 - "Surface Metrology"
- is responsible for the traceability of lengths and of parameters in surface metrology, i.e.
- for the calibration of step and depth setting standards
- for the calibration of roughness standards
- for the calibration of hardness reference blocks
- for the calibration of the layer thickness
- for the calibration of the resistant to bending of cantilevers and of the stiffness of micro-electromechanical systems (MEMS)
This Department …
- participates in the elaboration of standards and directives for surface metrology in national (VDI, DKD, DIN) and international committees (ISO, IMEKO),
- pursues and supports the development of standards and reference objects in the field of surface metrology, i.e. for tactile and optical procedures and for methods using scanning force microscopes, as well as for hardness and layer thickness metrology,
- is active in the field of research and development of new measuring instruments and measurement procedure as well as algorithms for the analysis and evaluation of data.
Fast surface measurements (roughness, E-module, hardness, deposits) with Si microprobes in injection nozzles.
- Light-induced force
- Proof of the theoretically predicted light attraction between coplanar plates with small distance.
- Mono-atomic step-height standards
- Processing procedure and measurement capabilities on mono-atomic steps on otherwise atomically smooth SI surfaces.
- Lateral resolution standards
- Geometry, manufacture, measurement and evaluation procedure of lateral resolution standards for microscopy and tactile measurement procedures.
- Software developement for roughness parameter determination
- EDevelopment of software standards for determination of the roughness parameters from surface measurement values.
NanoScale 2016 Poland
from 9 to 11 of March 2016
The 11th Seminar on Quantitative Microscopy and the 7th Seminar on Nanoscale Calibration took place in March at the Worclaw University of Technology in Worclaw, Poland. It was organized by Prof. T. Gotzalk, Wroclaw University of Technology, President D. Habich of the Central Office of Measures/Glówny Urzad Miar (GUM) in Warszawa, Poland, the Nanometrology Group of the EURAMET TC-Length, and the Physikalisch-Technische Bundesanstalt, Braunschweig Germany. About 90 participants from the whole world were informed in 20 talks and more than 40 posters about the latest status of nanometrology.