Optical microscopy

References

	J. Krüger, H. Xu, R. Koening, B. Bodermann Charakterisierung eines UV-Mikroskops zur hochgenauen Positions- und Breitenmessung am Nanometerkomparator (NMK) der PTB
	J. Krüger, R. Koening, B. Bodermann A phase retrieval inspired approach for the determination of optical aberrations in microscopy https://www.euspen.eu/res...berrations-in-microscopy/
	J. Krüger, R. Koening, B. Bodermann Characterization progress of a UV-microscope recently implemented at the PTB Nanometer Comparator for uni- and bidirectional measurements DOI: https://doi.org/10.1051/epjconf/202023806010
	J. Krüger, J. Grundmann, W. Wu, C. B. Rojas Hurtado, B. Bodermann, S. Kroker, H. S. Wasisto, A. Waag Charakterisierung der Transmissionsspektren von nano-strukturierten guided-mode resonance (GMR) Mikrofarbfiltern
	J. Krüger, R. Koening, B. Bodermann Systematic approach on illustrating the challenges represented by optical bidirectional measurements using rigorous simulations DOI: https://doi.org/10.1117/12.2527973
	M. Raab, I. Jusuk, J. Molle, E. Buhr, B. Bodermann, D. Bergmann, H. Bosse, P. Tinnefeld Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures DOI: doi.org/10.1038/s41598-018-19905-x
	B. Bodermann, R. Koening, D. Bergmann, W. Haessler-Grohne, J. Fluegge, H. Bosse The road towards accurate optical width measurements at the industrial level Although optical width (or bidirectional) measurements are as important as optical distance (or unidirectional) measurements many users are not aware of the specific difficulties of these measurements. The first requisite is the use of the correct thresho, Nuertingen, Germany, 08-11, September, 2013 Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology (2014) , page 35-41 DOI: 10.1007/978-3-642-36359-7_4
	B. Bodermann, R. Koening, D. Bergmann, E. Buhr, W. Haessler-Grohne, J. Fluegge, H. Bosse The road towards accurate optical width measurements at the industrial level Conference Optical Measurement Systems for Industrial Inspection, Munich, Germany, 10-16, May, 2013 Optical measurement systems for industrial inspection VIII; Proceedings of SPIE Volume 8788 (2013) DOI: 10.1117/12.2021888 [CD-ROM] file name: 8788_63.pdf, 87881S-1 - 87881S-12
	R. Koening, B. Bodermann, D. Bergmann, E. Buhr, W. Haessler-Grohne, J. Fluegge, H. Bosse Towards traceable bidirectional optical size measurements for optical coordinate measuring machine metrology MacroScale 2011 : recent developments in traceable dimensional measurements, Bern-Wabern, Switzerland, 04-06, October, 2011 MacroScale 2011 : recent developments in traceable dimensional measurements (2013) , page 13 DOI: 10.7795/810.20130620r Online only
	B. Bodermann, E. Buhr, L. Zhi, H. Bosse Quantitative optical microscopy at the nanoscale: new developments and comparisons Optical imaging and metrology : advanced technologies , 255 - 282 ( 2012) Buchartikel
	B. Bodermann, D. Bergmann, G. Ehret Fokuskriterien zur Kantendetektion an Phasenobjekten 108. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO), Heringsdorf, Germany, 29, May - 02, June, 2007 DGaO-Proceedings Volume 108 (2007) , page 27 Online only
	B. Bodermann, G. Ehret, A. Diener, D. Bergmann Quantitative dimensionelle Mikroskopie an Mikro- und Nanostrukturen: Untersuchungen zum Einfluss verschiedener Kantengeometrien 107. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO), Weingarten, Germany, 06-10, June, 2006 DGaO-Proceedings Volume 106 (2006) Online only

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