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Structure > Div. 7 Temperature and Synchrotron Radiation
Temperature and Synchrotron Radiation
Division 7
Highest accuracy and reliability of the realisation, maintenance and dissemination of units of radiation physics and thermodynamics, especially of the quantities spectral power of electromagnetic radiation, temperature, heat, pressure in vacuum. Development of new methods and techniques even in extreme areas, Advisory service and development of measuring systems for new metrological challenges

Latest news from division 7

Erfolgreiche Validierung des neues Messplatzes zur Kalibribierung von VUV-Strahlungsquellen an der Metrology Light Source

Ein neu aufgebauter Strahlungskomparator erlaubt die Kalibrierung von Strahlungsquellen rückführbar auf die berechenbare Synchrotronstrahlung der Metrology Light Source (MLS) im Spektralbereich von 7 nm bis 400 nm. Da weder die Strahlung des primären Strahlernormals MLS noch der zu kalibrierenden Quellen ...

Organic layers on invisible substrate

X-ray small-angle scattering under grazing incidence (GISAXS: Grazing Incidence Small Angle X-ray Scattering) is a versatile method for the contact-free determination of the size of vertical and lateral surface structures in the range from a few nanometers up to micrometers. In current fields of research and application such as self-organized nanostructured polymer films as organic photovoltaics systems, for functionalized surfaces in medicine or as form ...

Awards for young scientists

Dr. Beatrix Pollakowski of the X-Ray and IR Spectrometry group (AG 7.24) was awarded with the Young post-doc Award in X-ray Spectrometry of the European X-ray Spectrometry Association (EXSA) at the European conference on X-Ray Spectrometry (EXRS) which took place in Bologna (Italy) this year. The executive committee of EXSA honored Dr. Pollakowski for her excellent scientific ...

First polarization-resolved measurement with the new EUV ellipso-scatterometer

For many years, the Physikalisch-Technische Bundesanstalt (PTB) has been extending its measurement technology for the characterization of optical components in the extreme-ultraviolet spectral range (EUV). Thereby, it supports European companies which are worldwide leading in the development of EUV lithography for the manufacture of semiconductor components making use of radiation with a wavelength of 13.5 nm. Suitable measurement ...

Thermoelectric reference materials for Seebeck coefficients

Thermoelectric materials convert thermal energy directly into electric energy, and vice versa. The effectiveness of the energy conversion depends on the transport properties of the materials, on the Seebeck coefficient S, on the electric conductivity σ and on the thermal conductivity κ, which are summarized in the thermoelectric figure of merit ZT = S2σT/κ (T: absolute temperature). The ...

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Divisional Assistant
Margit Kleinsorge
Tel.: +49-30-3481-7464
E-Mail: Opens window for sending emailMargit.Kleinsorge@ptb.de

Physikalisch-Technische Bundesanstalt
Division 7
Abbestr. 2-12
10587 Berlin


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