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Structure > Div. 7 Temperature and Synchrotron Radiation
Temperature and Synchrotron Radiation
Division 7
Highest accuracy and reliability of the realisation, maintenance and dissemination of units of radiation physics and thermodynamics, especially of the quantities spectral power of electromagnetic radiation, temperature, heat, pressure in vacuum. Development of new methods and techniques even in extreme areas, Advisory service and development of measuring systems for new metrological challenges

Latest news from division 7

Awards for young scientists

Dr. Beatrix Pollakowski of the X-Ray and IR Spectrometry group (AG 7.24) was awarded with the Young post-doc Award in X-ray Spectrometry of the European X-ray Spectrometry Association (EXSA) at the European conference on X-Ray Spectrometry (EXRS) which took place in Bologna (Italy) this year. The executive committee of EXSA honored Dr. Pollakowski for her excellent scientific ...

First polarization-resolved measurement with the new EUV ellipso-scatterometer

For many years, the Physikalisch-Technische Bundesanstalt (PTB) has been extending its measurement technology for the characterization of optical components in the extreme-ultraviolet spectral range (EUV). Thereby, it supports European companies which are worldwide leading in the development of EUV lithography for the manufacture of semiconductor components making use of radiation with a wavelength of 13.5 nm. Suitable measurement ...

Thermoelectric reference materials for Seebeck coefficients

Thermoelectric materials convert thermal energy directly into electric energy, and vice versa. The effectiveness of the energy conversion depends on the transport properties of the materials, on the Seebeck coefficient S, on the electric conductivity σ and on the thermal conductivity κ, which are summarized in the thermoelectric figure of merit ZT = S2σT/κ (T: absolute temperature). The ...

273rd PTB Seminar

The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof on 24 and 25 October 2013. More than 110 participants from industry and research made use of these two days to discuss current developments with regard to the application, instrumentation and measuring techniques of ...

PTB's EUV reflectometer has moved to the EUV beamline at the MLS

European enterprises are world leaders in developing EUV lithography (EUVL). Starting approximately in 2016, it should be possible to use EUVL at a wavelength of 13.5 nm to manufacture semiconductor chips. PTB has supported this development since 1998 by providing the EUV measuring technology – originally at its laboratory at the electron storage ring BESSY I and since 2000 at BESSY II in order to improve the quality ...

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Divisional Assistant
Margit Kleinsorge
Tel.: +49-30-3481-7464
E-Mail: Opens window for sending emailMargit.Kleinsorge@ptb.de

Physikalisch-Technische Bundesanstalt
Division 7
Abbestr. 2-12
10587 Berlin


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