The working group is involved in the development and optimisation of dimensional metrology for micro- and nanotechnology. The instruments developed and used are mainly based on scanning probe microscopy methods. Apart from the design and setup of traceable Scanning Probe Microscope metrology systems also calibration standards and strategies are developed. Furthermore, calibration services in this field are provided for industry and institutes. Our aim is to keep and advance the high standards and low uncertainty of our nanometrology instruments.
Main focus of the research:
Head of Working Group: | Dr.-Ing. Hans-Ulrich Danzebrink Tel.: +49 531 592-5136 Fax: +49 531 592-5205 E-Mail: hans-ulrich.danzebrink@ptb.de | |
Secretariat | Christina Müller Tel.: 0531 592-5201 Fax: 0531 592-5205 E-Mail: christina.mueller@ptb.de | |
Address | Physikalisch-Technische Bundesanstalt Working Group 5.25 Bundesallee 100 38116 Braunschweig Germany |