There are two main centers of activity of the Department:
Form and wavefront metrology
Measurement of the form of optical surfaces and of optical wavefronts with uncertainties in the nanometre and sub-nanometre range. In addition, specific measurement tasks are performed to characterize optical components and materials, amongst others polarimetry and refractometry.
Quantitative and ultra-high resolution microscopy
Measurement of the size of surface structures in the µm and sub-µm range using optical methods. For ultra-high resolution microscopy, optical radiation with a wavelength of 193 nm is used.
In both fields of activity, basic research is carried out, new measuring methods are developed, research projects in co-operation with industry are realized and calibration services are offered.
| Head of Department | Dr. Egbert Buhr Phone: 0531 592-4200 E-mail: Egbert Buhr | |
| Secretariat | Nadine Weber Phone: 0531 592-4201 Fax: 0531 592-4205 E-mail: | |
| Address | Physikalisch-Technische Bundesanstalt Fachbereich 4.2 Bundesallee 100 38116 Braunschweig Germany |
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