There are two main centers of activity of the Department:
Form and wavefront metrology
Measurement of the form of optical surfaces and of optical wavefronts with uncertainties in the nanometre and sub-nanometre range. In addition, specific measurement tasks are performed to characterize optical components and materials, amongst others polarimetry and refractometry.
Quantitative and ultra-high resolution microscopy
Measurement of the size of surface structures in the µm and sub-µm range using optical methods. For ultra-high resolution microscopy, optical radiation with a wavelength of 193 nm is used. An additional task is the size measurement of nanoparticles using scanning electron microscopy.
In both fields of activity, basic research is carried out, new measuring methods are developed, research projects in co-operation with industry are realized and calibration services are offered.
| Head of Department | Dr. Egbert Buhr Phone: 0531 592-4200 E-mail: Egbert Buhr | |
| Secretariat | Iris Hopert Phone: 0531 592-4202 Fax: 0531 592-4205 E-mail: | |
| Address | Physikalisch-Technische Bundesanstalt Fachbereich 4.2 Bundesallee 100 38116 Braunschweig Germany |
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